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JEDEC JEP128 GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTING standard by JEDEC Solid State Technology Association, 11/01/1996
JEDEC JESD57 TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION standard by JEDEC Solid State Technology Association, 12/01/1996
JEDEC JESD8-8 ADDENDUM No. 8 to JESD8 - STUB SERIES TERMINATED LOGIC FOR 3.3 VOLTS (SSTL_3) A 3.3 V VOLTAGE BASED INTERFACE STANDARD FOR DIGITAL INTEGRATED CIRCUITS standard by JEDEC Solid State Technology Association, 08/01/1996
JEDEC JESD 24-11 (R2002) ADDENDUM No. 11 to JESD24 - POWER MOSFET EQUIVALENT SERIES GATE RESISTANCE TEST METHOD Amendment by JEDEC Solid State Technology Association, 08/01/1996
JEDEC JESD51-3 LOW EFFECTIVE THERMAL CONDUCTIVITY TEST BOARD FOR LEADED SURFACE MOUNT PACKAGES standard by JEDEC Solid State Technology Association, 08/01/1996
JEDEC EIA 318-B MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES standard by JEDEC Solid State Technology Association, 07/01/1996
JEDEC JEP103A (R2003) SUGGESTED PRODUCT-DOCUMENTATION, CLASSIFICATIONS, AND DISCLAIMERS standard by JEDEC Solid State Technology Association, 07/01/1996
JEDEC JESD 36 STANDARD DESCRIPTION OF LOW-VOLTAGE TTL-COMPATIBLE, 5 V TOLERANT CMOS LOGIC DEVICES standard by JEDEC Solid State Technology Association, 06/01/1996
JEDEC JESD32 STANDARD FOR CHAIN DESCRIPTION FILE standard by JEDEC Solid State Technology Association, 06/01/1996
JEDEC JEP126 GUIDELINE FOR DEVELOPING AND DOCUMENTING PACKAGE ELECTRICAL MODELS DERIVED FROM COMPUTATIONAL ANALYSIS standard by JEDEC Solid State Technology Association, 05/01/1996
JEDEC JESD55 STANDARD FOR DESCRIPTION OF LOW-VOLTAGE TTL-COMPATIBLE BiCMOS LOGIC DEVICES standard by JEDEC Solid State Technology Association, 05/01/1996
JEDEC JESD 35-2 ADDENDUM No. 2 to JESD35 - TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS standard by JEDEC Solid State Technology Association, 02/01/1996