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JEDEC JESD76-2 STANDARD DESCRIPTION OF 1.2 V CMOS LOGIC DEVICES (NORMAL RANGE OPERATION) standard by JEDEC Solid State Technology Association, 06/01/2001
JEDEC JESD72 (R2007) TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALS standard by JEDEC Solid State Technology Association, 06/01/2001
JEDEC JEP139 GUIDELINE FOR CONSTANT TEMPERATURE AGING TO CHARACTERIZE ALUMINUM INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING standard by JEDEC Solid State Technology Association, 12/01/2000
JEDEC JESD22-A102C (R2008) ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVE standard by JEDEC Solid State Technology Association, 12/01/2000
JEDEC JESD 22-A118 (R2008) ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST standard by JEDEC Solid State Technology Association, 12/01/2000
JEDEC JESD64-A STANDARD FOR DESCRIPTION OF 2.5 V CMOS LOGIC DEVICES WITH 3.6 V CMOS TOLERANT INPUTS AND OUTPUTS standard by JEDEC Solid State Technology Association, 10/01/2000
JEDEC JESD51-10 TEST BOARDS FOR THROUGH-HOLE PERIMETER LEADED PACKAGE THERMAL MEASUREMENTS standard by JEDEC Solid State Technology Association, 07/01/2000
JEDEC JESD51-9 TEST BOARDS FOR AREA ARRAY SURFACE MOUNT PACKAGE THERMAL MEASUREMENTS standard by JEDEC Solid State Technology Association, 07/01/2000
JEDEC JESD82 DEFINITION OF CDCV857 PLL CLOCK DRIVER FOR REGISTERED DDR DIMM APPLICATIONS standard by JEDEC Solid State Technology Association, 07/01/2000
JEDEC JEP120-A INDEX OF TERMS DEFINED IN JEDEC PUBLICATIONS standard by JEDEC Solid State Technology Association, 05/01/2000
JEDEC JESD76 DESCRIPTION OF 1.8 V CMOS LOGIC DEVICES standard by JEDEC Solid State Technology Association, 04/01/2000
JEDEC JESD286-B (R2005) STANDARD FOR MEASURING FORWARD SWITCHING CHARACTERISTICS OF SEMICONDUCTOR DIODES standard by JEDEC Solid State Technology Association, 02/01/2000