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Description / Abstract:
This practice covers the evaluation and reporting of uniaxial
strength data and the estimation ofWeibull probability distribution
parameters for advanced ceramics that fail in a brittle fashion
(see Fig. 1). The estimated Weibull distribution parameters are
used for statistical comparison of the relative quality of two or
more test data sets and for the prediction of the probability of
failure (or, alternatively, the fracture strength) for a structure
of interest. In addition, this practice encourages the integration
of mechanical property data and fractographic analysis.
The failure strength of advanced ceramics is treated as a
continuous random variable determined by the flaw population.
Typically, a number of test specimens with well-defined geometry
are failed under isothermal, well-defined displacement and/or
force-application conditions. The force at which each test specimen
fails is recorded. The resulting failure stress data are used to
obtain Weibull parameter estimates associated with the underlying
flaw population distribution.
This practice is restricted to the assumption that the
distribution underlying the failure strengths is the twoparameter
Weibull distribution with size scaling. Furthermore, this practice
is restricted to test specimens (tensile, flexural, pressurized
ring, etc.) that are primarily subjected to uniaxial stress states.
The practice also assumes that the flaw population is stable with
time and that no slow crack growth is occurring.
The practice outlines methods to correct for bias errors in the
estimated Weibull parameters and to calculate confidence bounds on
those estimates from data sets where all failures originate from a
single flaw population (that is, a single failure mode). In samples
where failures originate from multiple independent flaw populations
(for example, competing failure modes), the methods outlined in
Section 9 for bias correction and confidence bounds are not
applicable.
This practice includes the following:
The values stated in SI units are to be regarded as the standard
per IEEE/ASTM SI 10.