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JEDEC JESD6 (R2002)

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JEDEC JESD6 (R2002) MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

standard by JEDEC Solid State Technology Association, 02/01/1967

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This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.

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Published: 02/01/1967 Number of Pages: 17File Size: 1 file , 280 KB