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JEDEC JESD 353 (R2009)

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JEDEC JESD 353 (R2009) THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD

standard by JEDEC Solid State Technology Association, 04/01/1968

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This noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a l/f (power inversely proportional to frequency) power distribution. Formerly known as RS-353 and/or EIA-353.

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Published: 04/01/1968 Number of Pages: 9File Size: 1 file , 240 KB