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JEDEC JESD398 (R2009)

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JEDEC JESD398 (R2009) MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

standard by JEDEC Solid State Technology Association, 07/01/1972

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This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398

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Published: 07/01/1972 Number of Pages: 14File Size: 1 file , 420 KB