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JEDEC JEP138

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JEDEC JEP138 USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE

standard by JEDEC Solid State Technology Association, 09/01/1999

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Full Description

The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance.

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Published: 09/01/1999 Number of Pages: 11File Size: 1 file , 54 KB