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JEDEC JESD22-B112A

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JEDEC JESD22-B112A PACKAGE WARPAGE MEASUREMENT OF SURFACE-MOUNT INTEGRATED CIRCUITS AT ELEVATED TEMPERATURE

standard by JEDEC Solid State Technology Association, 10/01/2009

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$29.60

-60%

$74.00

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Full Description

The purpose of this test method is to measure the deviation from uniform flatness of an integrated circuit package body for the range of environmental conditions experienced during the surface-mount soldering operation.

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Published: 10/01/2009 Number of Pages: 30File Size: 1 file , 1 MB