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JEDEC JEP167

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JEDEC JEP167 Characterization of Interfacial Adhesion in Semiconductor Packages

standard by JEDEC Solid State Technology Association, 04/01/2013

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This document identifies methods used for the characterization of die adhesion. It gives guidance which method to apply in which phase of the product or technology life cycle.

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Published: 04/01/2013 Number of Pages: 30File Size: 1 file , 280 KB