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JEDEC JESD47J.01

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JEDEC JESD47J.01 STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

standard by JEDEC Solid State Technology Association, 09/01/2017

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Full Description

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.

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Published: 09/01/2017 Number of Pages: 30File Size: 1 file , 290 KB