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JEDEC JESD82-21 STANDARD FOR DEFINITION OF CUA845 PLL CLOCK DRIVER FOR REGISTERED DDR2 DIMM APPLICATIONS standard by JEDEC Solid State Technology Association, 01/01/2007
JEDEC J-STD-033B.1 JOINT IPC/JEDEC STANDARD FOR HANDLING, PACKING, SHIPPING AND USE OF MOISTURE/REFLOW SENSITIVE SURFACE-MOUNT DEVICES standard by JEDEC Solid State Technology Association, 01/01/2007
JEDEC JESD8-19 POD18 - 1.8 V Pseudo Open Drain I/O standard by JEDEC Solid State Technology Association, 12/01/2006
JEDEC JESD 82-22 INSTRUMENTATION CHIP DATA SHEET FOR FBDIMM DIAGNOSTIC SENSELINES standard by JEDEC Solid State Technology Association, 11/01/2006
JEDEC JESD89A MEASUREMENT AND REPORTING OF ALPHA PARTICLE AND TERRESTRIAL COSMIC RAY INDUCED SOFT ERRORS IN SEMICONDUCTOR DEVICES standard by JEDEC Solid State Technology Association, 10/01/2006
JEDEC JESD22-B117A SOLDER BALL SHEAR standard by JEDEC Solid State Technology Association, 10/01/2006
JEDEC JEP121A REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION standard by JEDEC Solid State Technology Association, 10/01/2006
JEDEC JEP179 DDR2 SPD INTERPRETATION OF TEMPERATURE RANGE AND (SELF-) REFRESH OPERATION standard by JEDEC Solid State Technology Association, 06/01/2006
JEDEC JP 002 CURRENT TIN WHISKERS THEORY AND MITIGATION PRACTICES GUIDELINE standard by JEDEC Solid State Technology Association, 03/01/2006
JEDEC JESD8-7A ADDENDUM No. 7 to JESD8 - 1.8 V + -0.15 V (NORMAL RANGE), AND 1.2 V - 1.95 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUIT standard by JEDEC Solid State Technology Association, 06/01/2006
JEDEC JESD202 METHOD FOR CHARACTERIZING THE ELECTROMIGRATION FAILURE TIME DISTRIBUTION OF INTERCONNECTS UNDER CONSTANT-CURRENT AND TEMPERATURE STRESS standard by JEDEC Solid State Technology Association, 03/01/2006
JEDEC JESD75-6 PSO-N/PQFN PINOUTS STANDARDIZED FOR 14-, 16-, 20-, AND 24-LEAD LOGIC FUNCTIONS standard by JEDEC Solid State Technology Association, 03/01/2006